Kim, Y., Thierry, D. M., & Biegler, L. T. (2020). Serial advanced-multi-step nonlinear model predictive control using an extended sensitivity method. J. Process Control, 96, 82-93. https://doi.org/10.1016/j.jprocont.2020.11.002
Kim, Y., Thierry, D. M., & Biegler, L. T. (2020). Serial advanced-multi-step nonlinear model predictive control using an extended sensitivity method. J. Process Control, 96, 82-93. https://doi.org/10.1016/j.jprocont.2020.11.002